Fullerenes Control Grain Size and Orientation in Nanomagnetic Thin Films
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چکیده
منابع مشابه
Grain size dependence of the twin length fraction in nanocrystalline Cu thin films via transmission electron microscopy based orientation mapping
Transmission electron microscopy (TEM) based orientation mapping has been used to measure the length fraction of coherent and incoherent R3 grain boundaries in a series of six nanocrystalline Cu thin films with thicknesses in the range of 26–111 nm and grain sizes from 51 to 315 nm. The films were annealed at the same temperature (600 °C) for the same length of time (30 min), have random textur...
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ژورنال
عنوان ژورنال: MRS Bulletin
سال: 2000
ISSN: 0883-7694,1938-1425
DOI: 10.1557/mrs2000.239